This chapter provides a general overview of the scientific principles and analytical procedures used in scattering techniques and their applications. Figure 1 shows a taxonomy (tree diagram) of the techniques that are covered in this chapter. The first branch classifies the techniques according to the wavelength of the incident electromagnetic (EM) radiation: visible light (700–400 nm), X-rays (0.33–0.06 nm), as well as neutrons (2.5–0.15 nm). The next branch classifies techniques into those based on the measured intensities (i.e., scattering), where the radiation exiting the sample is measured at an angle relative to the incident beam, or transmission, where this angle is equal to zero. Scattering techniques can be further classified based on how the exiting radiation is quantified, in either a time-averaged (static) or time-dependent (dynamic) mode. Finally, because scattering techniques are often coupled with separation techniques, such as chromatography or field flow fractionation, these are included as well.